100G（4x28GBd）、400G（4x56GBd）；800G（8x56GBd）
BA-4000误码率分析仪 - 800G电误码率分析仪
概述
支持NRZ和PAM4编码的电误码率分析仪，配备先进的FEC工具，支持800G测试。
应用
测试和验证光模块与线缆
测试光器件和PIC
测试高速集成电路
亮点
Complete suite of bit analyzers for R&D and manufacturing up to 800G
The BA-4000 is a world-class series of 100G/800G electrical bit-error-rate (BER) testers. It is designed for the production line, quality control and R&D use from components to transceivers and cables.
The BA-4000-RCNC model has been specifically designed to enable the testing of linear-drive pluggable optics (LPO), a technology addressing the need of high bandwidth and low power interconnects required by AI/ML applications. The strong correlation between the BA-4000-RCNC test results and real switch performance reduces uncertainty, allowing manufacturers to qualify transceivers with confidence and efficiency.
强大的均衡器和通道模拟器，专为LPO测试设计
对于LPO光模块，没有DSP来预处理或均衡电信号，如同在重新定时光系统中那样。因此，host侧信号完整性的任何变化都会反映到光侧，而信号切换的次数越多，造成误码的可能性就越大。传统的光模块测试技术无法检测到这种信号劣化，因此需要新的、更强大的测试技术。BA-4000-RCNC可以检测到是否存在反射、码间干扰（ISI）和前向纠错（FEC）尾部不稳定性，这些都是关键的性能指标，从而能够检测到是否存在误码。
