Resources
All resources
Flyers and pamphlets
PIC-Optical integrated circuits test solution - 日本語
(October 26, 2021)
Webinar
Spectral characterization of photonic integrated circuits - English
(May 16, 2023)
Spec sheet
T200S - English
(June 30, 2025)
Spec sheet
T200S - Français
(June 30, 2025)
Spec sheet
T200S - 中文
(June 30, 2025)
Spec sheet
T500S - English
(June 06, 2025)
Spec sheet
T500S - Français
(June 06, 2025)
Spec sheet
T500S - 中文
(June 06, 2025)
Webinar
Testing cutting-edge optical components with cutting-edge technologies - English
(May 16, 2023)
Blog
Tiny PICs with Huge Impact - English
(April 14, 2020)
Webinar
Tiny PICs with Huge Impact: Meeting the Challenges of Photonic Integrated Circuits testing for next-generation networks - English
(May 16, 2023)
Brochures and catalogs
Optical testing solutions for universities and labs - English
(December 23, 2024)
Spec sheet
OPAL-MD – Multi-die test station - English
(July 11, 2025)
Spec sheet
OPAL-MD – Multi-die test station - Français
(July 11, 2025)
Spec sheet
OPAL-MD – Multi-die test station - 中文
(July 11, 2025)
Spec sheet
OPAL-MD – Multi-die test station - 日本語
(July 11, 2025)
Product demos
Introducing the OPAL-MD, probe station for multi-die testing - English
(March 28, 2024)