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BA-4000 - Electrical 800G Bit Error Rate Tester

Electrical BER tester supporting NRZ and PAM4 coding, with advanced FEC tools and with testing capabilities up to 800G.

Key features

100G (4x28GBd), 400G (4x56GBd) & 800G (8x56GBd)
Supports NRZ and PAM4
Supports PRBS 7/9/11/13/15/23/31/13Q/31Q, SSPRQ
FEC capability: RS-FEC Scrambled Idle Pattern for testing 53 GBd host side interfaces
Channel simulator
Burst/random error injection
Supports linear/gray mapping
O-SMPM connection
Reflection cancellation and noise cancellation (RCNC) for LPO testing

Applications

Test and validation of transceivers and cables
Test of optical components and PIC
Test of high-speed electrical IC

Complete suite of bit analyzers for R&D and manufacturing up to 800G

The BA-4000 is a world-class series of 100G/800G electrical bit-error-rate (BER) testers. It is designed for the production line, quality control and R&D use from components to transceivers and cables. 

The BA-4000-RCNC model has been specifically designed to enable the testing of linear-drive pluggable optics (LPO), a technology addressing the need of high bandwidth and low power interconnects required by AI/ML applications. The strong correlation between the BA-4000-RCNC test results and real switch performance reduces uncertainty, allowing manufacturers to qualify transceivers with confidence and efficiency.

Powerful equalizer and channel simulator designed for LPO testing

With LPO transceivers, no DSP is present to precondition or equalize the electrical signal, as is done in retimed optics. Therefore, any change in signal integrity on the host side is reflected onto the optical side and the more times the signal is handed off, the more potential for introduction of bit errors. Traditional transceiver testing techniques can’t pick up this signal degradation so new, more powerful testing techniques are required. The BA-4000-RCNC detects the presence of reflection, intersymbol interference (ISI) and FEC tail instability which are key performance indicators, capturing the presence of errors. 

Accessories

Explore a curated selection of accessories designed to enhance performance, improve usability, and maximize the potential of your product.

Resources

All resources
Flyers and pamphlets
Leading-edge transmission testing up to 800G - English (October 26, 2021)
Flyers and pamphlets
Leading-edge transmission testing up to 800G - 中文 (October 26, 2021)
Flyers and pamphlets
Leading-edge transmission testing up to 800G - 日本語 (October 26, 2021)
Application notes
Testing next-gen PIC-based transceivers - English (July 07, 2021)
Flyers and pamphlets
Testing photonics and optical components for manufacturing, design and research challenges - English (June 20, 2023)
Flyers and pamphlets
Testing photonics and optical components for manufacturing, design and research challenges - 中文 (June 20, 2023)
Flyers and pamphlets
Testing photonics and optical components for manufacturing, design and research challenges - 日本語 (June 20, 2023)
Flyers and pamphlets
BA-4000 now with 800G FEC Generator and Checker (FGC) - English (October 26, 2021)
Flyers and pamphlets
BA-4000 now with 800G FEC Generator and Checker (FGC) - 中文 (October 26, 2021)
Flyers and pamphlets
BA-4000 now with 800G FEC Generator and Checker (FGC) - 日本語 (October 26, 2021)
Flyers and pamphlets
EXFO demos - OIF interops - English (March 18, 2022)
Flyers and pamphlets
PIC-Optical integrated circuits test solution - 日本語 (October 26, 2021)
Declaration of conformity
BA-4000 | CE - English (June 29, 2021)
Product demos
800G bit-error-rate testing enhanced with FEC capabilities - English (May 18, 2023)
Product demos
Leading-edge BER testing up to 800G - English (May 18, 2023)
Blog
64G Fibre Channel: understanding the testing and validation process - English (March 19, 2024)

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